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Advanced Test Methods for SRAMs

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Language EnglishEnglish
Book Paperback
Book Advanced Test Methods for SRAMs Girard
Libristo code: 09062252
Publishers Springer-Verlag New York Inc., September 2014
Valuable testing and diagnostic methods for the latest generation of static random access memory (SR... Full description
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Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here.§

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About the book

Full name Advanced Test Methods for SRAMs
Author Girard, Patrick, PH.
Language English
Binding Book - Paperback
Date of issue 2014
Number of pages 171
EAN 9781489983145
ISBN 9781489983145
Libristo code 09062252
Weight 297
Dimensions 155 x 235 x 235
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