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Advanced Test Methods for SRAMs

Name: Advanced Test Methods for SRAMs
Brand: Springer-Verlag New York Inc.
SKU: 01420517
Price: 41699 HUF
Availability: InStock
Author: Patrick Girard
ISBN: 9781441909374

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Patrick Girard

Alberto Bosio

Luigi Dilillo

Language

English

Book Hardback

Libristo code: 01420517

Publishers Springer-Verlag New York Inc., October 2009

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing... Full description

Libristo code: 01420517

285 b

41 699 Ft

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Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.