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Surface Roughness Study by Atomic Force Microscopy

Surface Roughness-Practical Example

Language EnglishEnglish
Book Paperback
Book Surface Roughness Study by Atomic Force Microscopy Md.Abu Sayeed
Libristo code: 07085730
Publishers LAP Lambert Academic Publishing, February 2012
AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capab... Full description
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AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.

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About the book

Full name Surface Roughness Study by Atomic Force Microscopy
Author Md.Abu Sayeed, Zakia Ferdous
Language English
Binding Book - Paperback
Date of issue 2012
Number of pages 72
EAN 9783848400355
Libristo code 07085730
Publishers LAP Lambert Academic Publishing
Weight 118
Dimensions 152 x 229 x 4

Categories

Mathematics & Science > Physics
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