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Stress Induced Phenomena in Metallization

Name: Stress Induced Phenomena in Metallization
Brand: Springer, Berlin
SKU: 01390770
Price: 47137 HUF
Availability: InStock
Author: Shefford P. Baker
ISBN: 9780735400580

Sixth International Workshop on Stress Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001

Language

English

Book Hardback

Libristo code: 01390770

Publishers Springer, Berlin, November 2001

Tiny metal structures, less than a millionth of a meter across, are critical building blocks in a nu... Full description

Libristo code: 01390770

315 b

47 137 Ft

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Tiny metal structures, less than a millionth of a meter across, are critical building blocks in a number of high-tech devices such as computer chips. These "metallizations" are subjected to extreme conditions of temperature, electric current density, and mechanical load, which may cause the device they are in to fail. This book contains research papers on these metallizations and on the reliability problems associated with them. The papers were peer reviewed for these proceedings.