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Semiconductor Memory Testing

Name: Semiconductor Memory Testing
Brand: VDM Verlag Dr. Müller
SKU: 06827526
Price: 17720 HUF
Availability: InStock
Author: Anuj Gupta
ISBN: 9783639194401

Fault Models and Test Considerations for High Performance Embedded SRAM's

Anuj Gupta

Language

English

Book Paperback

Libristo code: 06827526

Publishers VDM Verlag Dr. Müller, November 2008

Stringent test quality requirements, at-speed test limitations & total cost associated with using ex... Full description

Libristo code: 06827526

121 b

17 720 Ft

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Stringent test quality requirements, at-speed test limitations & total cost associated with using expensive off-chip testers for embedded memory testing have forced system designers to introduce on-chip Memory Built-in Self Test (MBIST) techniques to generate, apply, read and compares test patterns in order to expose subtle defects of SRAM''s. The book discusses in detail the various fault models and test requirements associated with embedded SRAM s in today s System-On-Chip s and focuses on the implementation of testing algorithms for embedded SRAMs in the MBIST engine. The book also discusses a finding where failure analysis and silicon debug required an update to the algorithms and pattern backgrounds implemented in the MBIST.