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Scanning Probe Microscopy

Physical Property Characterization at Nanoscale

Language EnglishEnglish
Book Hardback
Book Scanning Probe Microscopy Vijay Nalladega
Libristo code: 24120415
Publishers In Tech, April 2012
Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnol... Full description
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Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.

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About the book

Full name Scanning Probe Microscopy
Language English
Binding Book - Hardback
Date of issue 2012
Number of pages 258
EAN 9789535105763
ISBN 9535105760
Libristo code 24120415
Publishers In Tech
Weight 612
Dimensions 170 x 244 x 16
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