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Noncontact Atomic Force Microscopy

Name: Noncontact Atomic Force Microscopy
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
SKU: 01564043
Price: 74215 HUF
Availability: InStock
Author: Seizo Morita
ISBN: 9783540431176

Seizo Morita

Roland Wiesendanger

Ernst Meyer

Language

English

Book Hardback

Libristo code: 01564043

Publishers Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, July 2002

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based... Full description

Libristo code: 01564043

498 b

74 215 Ft

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.