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Materials Reliability Issues in Microelectronics: Volume 225

Language EnglishEnglish
Book Hardback
Book Materials Reliability Issues in Microelectronics: Volume 225 James R. LloydFrederick G. YostPaul S. Ho
Libristo code: 02059930
Publishers Materials Research Society, October 1991
With the increased complexity of modern integrated circuits, it is important that reliability proble... Full description
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With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include: electromigration; stress effects on reliability; stress and packaging; metallization; device, oxide and dielectric reliability; new investigative techniques; corrosion.

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About the book

Full name Materials Reliability Issues in Microelectronics: Volume 225
Language English
Binding Book - Hardback
Date of issue 1991
Number of pages 382
EAN 9781558991194
ISBN 1558991190
Libristo code 02059930
Weight 700
Dimensions 155 x 235 x 25
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