Free shipping on orders over 19,990 Ft via Packeta, Fox Post Box, and DPD Collection Point

Check order status

Become part of a community of book lovers from all over the world and get access to a whole bunch of benefits. Create an account for free

Free delivery for purchases over 19 990 Ft

DPD courier 1 190 Ft Hungarian Post 1 795 Ft Hungarian Post 1 690 Ft Hungarian Post 1 690 Ft FoxPost 1 190 Ft Packeta point 1 190 Ft DPD point 990 Ft GLS courier 1 690 Ft GLS point 1 190 Ft

Contact

How to shop

Help

My account

▸ Empty :-(

Free shipping on orders over 19,990 Ft via Packeta, Fox Post Box, and DPD Collection Point

ESD Physics and Devices

Steven H. Voldman

Language

English

Book Hardback

Libristo code: 04886114

Publishers John Wiley & Sons Inc, September 2004

This volume is the first in a series of three books addressing Electrostatic Discharge (ESD) physics... Full description

Libristo code: 04886114

385 b

56 056 Ft

In stock at our supplier Shipping in 10-18 days

Up to 30 days for returns

Customers also purchased

Leide nicht - liebe, 2 Audio-CDs Werner Ablass

Audio CD

8 106 Ft

kleine Gecko Gusto... Ingrid Trölsch

Paperback

4 540 Ft

This volume is the first in a series of three books addressing Electrostatic Discharge (ESD) physics, devices, circuits and design across the full range of integrated circuit technologies. "ESD Physics and Devices" provides a concise treatment of the ESD phenomenon and the physics of devices operating under ESD conditions. Voldman presents an accessible introduction to the field for engineers and researchers requiring a solid grounding in this important area. The book contains advanced CMOS, Silicon On Insulator, Silicon Germanium, and Silicon Germanium Carbon. In addition, it also addresses ESD in advanced CMOS with discussions on shallow trench isolation (STI), Copper and Low K materials.This book provides a clear understanding of ESD device physics and the fundamentals of ESD phenomena. It analyses the behaviour of semiconductor devices under ESD conditions. It addresses the growing awareness of the problems resulting from ESD phenomena in advanced integrated circuits. It covers ESD testing, failure criteria and scaling theory for CMOS, SOI (silicon on insulator), BiCMOS and BiCMOS SiGe (Silicon Germanium) technologies for the first time. It discusses the design and development implications of ESD in semiconductor technologies. It is an invaluable reference for EMC non-specialist engineers and researchers working in the fields of IC and transistor design. It is also suitable for researchers and advanced students in the fields of device/circuit modelling and semiconductor reliability.