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Books in English > Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering > Electronics: circuits & components > Automatic Analog IC Sizing and Optimization Constrained with PVT Corners and Layout Effects

Automatic Analog IC Sizing and Optimization Constrained with PVT Corners and Layout Effects

Name: Automatic Analog IC Sizing and Optimization Constrained with PVT Corners and Layout Effects
Brand: Springer International Publishing AG
SKU: 12580491
Price: 37512 HUF
Availability: InStock
Author: Nuno Lourenço
ISBN: 9783319420363

Nuno Lourenço

Ricardo Martins

Nuno Horta

Language

English

Book Hardback

Libristo code: 12580491

Publishers Springer International Publishing AG, July 2016

This book introduces readers to a variety of tools for automatic analog integrated circuit (IC) sizi... Full description

Libristo code: 12580491

249 b

37 512 Ft

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This book introduces readers to a variety of tools for automatic analog integrated circuit (IC) sizing and optimization. The authors provide a historical perspective on the early methods proposed to tackle automatic analog circuit sizing, with emphasis on the methodologies to size and optimize the circuit, and on the methodologies to estimate the circuit's performance. The discussion also includes robust circuit design and optimization and the most recent advances in layout-aware analog sizing approaches. The authors describe a methodology for an automatic flow for analog IC design, including details of the inputs and interfaces, multi-objective optimization techniques, and the enhancements made in the base implementation by using machine leaning techniques. The Gradient model is discussed in detail, along with the methods to include layout effects in the circuit sizing. The concepts and algorithms of all the modules are thoroughly described, enabling readers to reproduce the methodologies, improve the quality of their designs, or use them as starting point for a new tool. An extensive set of application examples is included to demonstrate the capabilities and features of the methodologies described.??