Free shipping on orders over 19,990 Ft via Packeta, Fox Post Box, and DPD Collection Point

Check order status

Become part of a community of book lovers from all over the world and get access to a whole bunch of benefits. Create an account for free

Free delivery for purchases over 19 990 Ft

DPD courier 1 190 Ft Post 1 795 Ft Post 1 690 Ft Post 1 690 Ft FoxPost 1 190 Ft Packeta point 1 190 Ft DPD point 990 Ft GLS courier 1 690 Ft GLS point 1 190 Ft

Contact

How to shop

Help

My account

▸ Empty :-(

Free shipping on orders over 19,990 Ft via Packeta, Fox Post Box, and DPD Collection Point

Atomic Force Microscopy - Understanding Basic Modes and Advanced Applications

Name: Atomic Force Microscopy - Understanding Basic Modes and Advanced Applications
Brand: John Wiley & Sons Inc
SKU: 01388618
Price: 62038 HUF
Availability: InStock
Author: Greg Haugstad
ISBN: 9780470638828

Greg Haugstad

Language

English

Book Hardback

Libristo code: 01388618

Publishers John Wiley & Sons Inc, October 2012

This book enlightens readers on the basic surface properties and distance-dependent intersurface for... Full description

Libristo code: 01388618

423 b

62 038 Ft

In stock at our supplier Shipping in 9-15 days

30-day return policy

Customers also purchased

Virgin Road - Die Henkerin und ihre Art zu Leben 06 Mato Sato

Paperback

2 860 Ft

Fonologie českých anglicismů Aleš Bičan

Sheet

2 540 Ft

Nachrichten von Hermann und Erika Heft 45/2020 Natur- und Heimatkunde Tostedt und Umgebung e Verein für Geschichte

Paperback

3 609 Ft

Procvičujeme si ... Geometrie a slovní úlohy Michaela Kaslová; Dana Fialová

Paperback

676 Ft

Praxishandbuch Pferdeweide Ingolf Bender

Hardback

12 489 Ft

L'Ontologie Jeremy Bentham

Paperback

3 887 Ft

Více než lidé Henry Kuttner

Paperback

3 919 Ft

Matematika 9 sbírka úloh, pracovní sešit s komentářem pro učitele collegium

Paperback

2 027 Ft

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.§"Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com"